研讨会

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  ESD and Efficient Electronic Design - Finding and Fixing Problems at the IC Level

  In this webinar we will discuss the impact of IC behavior on electronic design, the characteristics of ESD and how they influence a device by influencing the ICs. 49 min

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  Connectors - cause of EMC problems. Burst test on a burst interface system

  In this video the immunity of a connector for a bus interface is tested. Nowadays particularly the transmission of sensitive data signals should occur without mistake. Here the weak spots are usually the used connectors. 4:33 min

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  EMC Interference Suppression with Near-Field Probes & Spectrum Analyzer Software ChipScan-ESA pt1

  This video shows how to localize EMC interference suppression with near-field probes and how to display, record and compare the measured results with the spectrum analyzer software ChipScan-ESA. 5:25 min

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  EMC Interference Suppression with Near-Field Probes & Spectrum Analyzer Software ChipScan-ESA pt2

  This video shows how to localize EMC interference suppression with near-field probes and how to display, record and compare the measured results with the spectrum analyzer software ChipScan-ESA. 8:44 min