ICR HV500-75
近场微探头(200KHz-1GHz)
![ICR HV500-75, 近场微探头(200KHz-1GHz)](/fileadmin/ICR Nahfeld Mikro sonde IC test security Sicherheit Störaussenung emission Langer hoch auflösend high resolution ICR HV500-75.jpg?v=1723643593082)
Short description
这种探头以很高的分辨率和敏感性测量磁场。距离被测物小于1mm时效果最佳。与ICR HV 500-6型微探头相比,ICR HV 500-75型微探头在低频范围内能产生较高的输出信号。在探头内部,测量线圈是竖直放置的。
The probe head is shielded against electric field coupling. A preamplifier is integrated in the probe housing, which is powered by the BT 706 bias tee. Adjustment screws on the housing allow manual alignment of the probe tip to the probe housing.
The probe supports the collision protection function of the Langer scanners, which stops the movement during vertical travel if the device under test is touched.
The housing can also be mounted on commercially available testers.
Attention! The tip is very sensitive to impact due to its construction, therefore we recommend positioning the probe through an automatic positioning system.