SX-E 03
电场探头(1GHz-10GHz)
![SX-E 03, 电场探头(1GHz-10GHz)](/fileadmin/Bilder300/Disturbance emission_near field probe_SX-E 03_function_en_wPZ.png?v=1723643593082)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf SX-E 03_wPZ.jpg?v=1723643593082)
Short description
SX-E 03型探头底部的电极尺寸约为4x4mm,用于检测定位很小的电场源,例如导线、集成电路板上的单个元器件。
The SX-E 03 is a passive near-field probe. To measure, the probe head is positioned directly onto the measured object, due to higher electrical field strength at the measured object. The near-field probe is small and handy. It has a current attenuating sheath and its upper side is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.