XF-U 2.5-1
磁场探头(30MHz-6GHz)
![XF-U 2.5-1, 磁场探头(30MHz-6GHz)](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-U 2.5-1_function_en_wPZ.png?v=1721124529905)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf XF-U 2,5-1_wPZ.jpg?v=1721124532028)
Short description
XF-U 2.5-1型磁场探头是一个近场探头,用于选择性测量导线、SMD组件和IC引脚中的高频电流。这个探头有一个大约0.5mm宽的磁场敏感缺口,测量时将这个缺口放在布线、IC或者电容器的连接点上。
The XF-U 2.5-2 is a passive near-field probe that is designed for SMD components (pins). The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.