RF-R 3-2
磁场探头(30MHz-3GHz)
Short description
RF-R 3-2型近场探头,分辨率高,用于直接检测电子组装件上的射频磁场,例如引脚区域、集成电路外壳、导线、旁路电容器和电磁兼容性(EMC)元件等的磁场。
The near-field probe can be used for RF injection in the context of a surface scan in according to IEC 62132-9. The maximum forward power [dBm] for this application is shown in the diagram below. The curve for the probe factor used to calculate the decoupled fields strength is available from our sales department. Please note that the probe must not be held in the hand during coupling, and the user must ensure appropriate shielding from the surrounding environment. Langer EMV-Technik GmbH assumes no liability for damage to persons or equipment resulting from improper handling during coupling.