LFS-B 3
磁场探头(100KHz-50MHz) SMA
![LFS-B 3, 磁场探头(100KHz-50MHz) SMA](/fileadmin/Bilder300/Disturbance emission_near field probe_LF-B 3_function_en_wPZ.png?v=1721026804401)
![](/fileadmin/Bilder300/2017 LFS-B 3-2 Scanner-Probe.jpg?v=1721026806847)
![LFS-B 3-2 scanner probe connected to ICS 105 scanner](/fileadmin/Bilder300/Probe LFS-B 3-2 connected ICS105 scanner.jpg?v=1721026806847)
Short description
LF-B3型磁场探头的测量线圈相对垂直于探头柄。当探头竖直放置电路板上时,其测量线圈直接平放在电路板的表面上。由此就能够测量到印刷电路板表面上很难达到的一些位置,如开关调节器的大元件之间的位置。
The LFS-B 3 is a passive near-field probe for use in a scanner to measure magnetic field during development. The LFS-B 3 detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected. The near-field probe is small and handy. It has a current attenuating sheath and is, therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.