XF-R 400-1
磁场探头(30MHz-6Hz)
![XF-R 400-1, 磁场探头(30MHz-6Hz)](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 400_function_en_wPZ.png?v=1721133633554)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf XF-R 400_wPZ.jpg?v=1721133633554)
Short description
XF-R 400-1磁场探头 因较大的直径(25mm)而拥有很高的灵敏度,允许在10cm以内的距离测量模块和设备。
The XF-R 400-1 is a passive near-field probe. In principle it has the same structure as the XF-R 100-1 and XF-R 3-2 probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.