Advantage of Measurements with Near-Field Microprobes

When measuring interference emission with near-field microprobes from Langer EMV-Technik GmbH, the magnetic and electric fields are measured separately. Due to the small probes combined with a high sensitivity, a resolution of up to 60 µm and with frequencies up to 6 GHz can be realized.

What is needed from the Customer?

• Data sheet of the IC
• Test circuit diagram (in coordination with test engineer)
• Test firmware with description (in coordination with test engineer)
• 1 - 2 ICs with test firmware

What does the Customer get?

• 5 test PCBs, assembled/unassembled, depending on the number of test ICs
• Documentation of the measurement results with the ChipScan-Scanner software
• Test report

The preparation of a quotation depends on the exact measurement task (e.g. size of scan area, number of measurement points, frequency range) of the customer. Please contact the sales department of Langer EMV-Technik GmbH.