- 2015
- Development of the IC Tester ICT1
- 2015
- Extension of frequency up to 10 GHz of the near-field probe group
- 2012
- Extension of the analog measurement system A300 up to a range of 5 MHz
- 2010
- Extension of frequency up to 6 GHz of the near-field probe group
- 2009
- Company certification as supporter of further education
- 2008
- Launch of ESD-field sources for IC-Test
- 2008
- Development of new ICR near-field microprobes for IC scanner up to 6 GHz with an inner diameter of 100 µm
- 2007
- Launch of the IC scanners with ChipScan-Scanner software
- 2006
- Extension of the analog measurement system A200 up to a range of 500 kHz
- 2005
- Launch of ICR near field microprobes with an inner diameter of 150 µm
- 2003
- Introduction of EMV IC Test-system for RF-compliant current and voltage measurements and Burst current and Burst voltage supply in separate pins.
- 2002
- Launch of development system emitted interference ESA1
- 2001
- Research on emitted interference problems of automotive electronics
- 2000
- Production of the first analog measuring systems A100
- 1998
- X Magnetic field sources and E-field sources for Burst generators according to EN 61000-4-4, launch of the first RF near-field probes
- 1997
- Development of the first digital optical measuring systems OSE
- 1996
- Launch of development system interference immunity E1
- 1994
- Research for technological protection of assemblies against burst disturbance
- 1993
- Start of industry EMC consulting
- 1980
- basic EMC research (18 patents and utility models / 4 European registrations)
Milestones
Langer EMV-Technik GmbH develops measuring devices for accompanying EMV-analysis during the assembly development (PCB) and IC development (IC)