RF-R 0.3-3
迷你型磁场探头(30MHz-3GHz)
![RF-R 0.3-3, 迷你型磁场探头(30MHz-3GHz)](/fileadmin/Bilder300/Disturbance emission_near field probe_RF-R 0.3-3_function_en_wPZ.png?v=1723643593082)
![Probe head](/fileadmin/Bilder300/2014.11.14 Sondenkopf RF-R 0,3-3_wPZ.jpg?v=1723643593082)
Short description
RF-R 0.3-3型磁场探头的探针很小,能够以很高的分辨率测量高频磁场,从而识别出产生干扰的最小元件。此外,小探头适合于在很难靠近的位置进行测量,例如在集成电路引脚周围。
The RF-R 0.3-3 is a passive near-field probe. In principle it has the same structure as the H-field probes RF-R 50-1 and RF-R 400-1. The RF-R 0.3-3 has a significantly higher resolution. The H-field probe is suitable for measurements close to the components in high magnetic electric field strength range. The coil openings of the RF-R 0.3-3 probe are marked with white dots. Because of its small design measurements can be easily made at hard to reach spots, e.g. between components. The near-field probe is small and handy. It has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.