RF-R 0.3-3
H-Field Probe mini 30 MHz up to 3 GHz
![RF-R 0.3-3, H-Field Probe mini 30 MHz up to 3 GHz](/fileadmin/Bilder300/Disturbance emission_near field probe_RF-R 0.3-3_function_en_wPZ.png?v=1723643593082)
![Probe head](/fileadmin/Bilder300/2014.11.14 Sondenkopf RF-R 0,3-3_wPZ.jpg?v=1723643593082)
Short description
With its small probe head, the RF-R 0.3-3 can measure magnetic fields in very high resolution. Thus even smallest components can be detected as interference sources. Furthermore, the small probe head is suitable for measurements at hard to reach spots, e.g. near IC pins.
The RF-R 0.3-3 is a passive near-field probe. In principle it has the same structure as the H-field probes RF-R 50-1 and RF-R 400-1. The RF-R 0.3-3 has a significantly higher resolution. The H-field probe is suitable for measurements close to the components in high magnetic electric field strength range. The coil openings of the RF-R 0.3-3 probe are marked with white dots. Because of its small design measurements can be easily made at hard to reach spots, e.g. between components. The near-field probe is small and handy. It has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.