XF-R 100-1
磁场探头(30MHz-6GHz)
![XF-R 100-1, 磁场探头(30MHz-6GHz)](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 100_function_en_wPZ.png?v=1721113204126)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf XF-R 100_wPZ.jpg?v=1721113206638)
Short description
XF-R 100-1型磁场探头用于测量模块、设备或电缆,可以在距离被测物3cm以内使用。利用该磁场探头能够识别较大组件是否为潜在的干扰源。这种磁场探头呈现很高的带宽和线性度。
The XF-R 100-1 is a passive near-field probe. The probe head’s size, and thus its resolution range, is between that of the XF-R 400-1 (25 mm) and XF-R 3-1 (3mm) probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.