XF-R 100-1
H-Field Probe 30 MHz up to 6 GHz
![XF-R 100-1, H-Field Probe 30 MHz up to 6 GHz](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 100_function_en_wPZ.png?v=1721132662499)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf XF-R 100_wPZ.jpg?v=1721132664612)
Short description
The XF-R 100-1 H-field probe is suitable for measurements around assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can identify larger components as potential sources of interference. The magnetic field probe has a very high bandwidth and linearity.
The XF-R 100-1 is a passive near-field probe. The probe head’s size, and thus its resolution range, is between that of the XF-R 400-1 (25 mm) and XF-R 3-1 (3mm) probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.