XFS-R 3-1
![XFS-R 3-1](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 3-1_function_en_wPZ.png?v=1721124529905)
![](/fileadmin/Bilder300/2017.08.16 XFS-R 3-1 Scanner-Sonde.jpg?v=1721124532028)
The XFS-R 3-1 H-field scanner probe is suitable for measurements close to the components with high magnetic field strength. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.