XFS-R 3-1
Scanner Probe 30 MHz up to 6 GHz
![XFS-R 3-1, Scanner Probe 30 MHz up to 6 GHz](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 3-1_function_en_wPZ.png?v=1721113204126)
![](/fileadmin/Bilder300/2017.08.16 XFS-R 3-1 Scanner-Sonde.jpg?v=1721113206638)
Short description
The XFS-R 3-1 scanner probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.
The XFS-R 3-1 H-field scanner probe is suitable for measurements close to the components with high magnetic field strength. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.