ICEM 1-150

Measurement service for IC Emission using 1 Ohm/150 Ohm method acc. to IEC 61967-4

The ICEM 1-150 measurement service determines the conducted electromagnetic emission (EME) of a test IC by directly measuring the radio frequency (RF) current with a 1 Ω probe and measuring the RF voltage with a 150 Ω coupling network acc. to IEC 61967-4 standard. Frequency range: 150 kHz – 3 GHz

ICEM Field

Measurement service for IC Emission Measurement using Field Coupled Analysis

The ICEM Field measurement service determines the respective near fields, that are decoupled by the test IC in function, by means of separate magnetic and E-field sources. The ICEM Field measuremt service is a further investigation to the tests according to IEC 61967 (TEM or IC stripline). The measu…

ICEM Scan

Measurement Service for IC Emission with Stripline acc. to IEC/TS 61967-3

The ICEM Scan measurement service determines the near-field electrical or magnetical components on or near the surface of an IC in accordance with the IEC/TS 61967-3 standard. This diagnostic procedure is used for architectural analysis of an IC such as manufacturing planning and optimization of pow…

ICEM SL

Measurement service for IC Emission Measurement with Stripline acc. to IEC 61967-8

The ICIM SL measurement service determines the electromagnetic radiation of an IC in the frequency range from 150 kHz to 3 GHz in accordance with the IEC 61967-8 standard. The test IC is mounted on an IC measurement adapter printed circuit board (PCB), which is located between the active conductor a…

ICEM TEM

Measurement service for IC Emission Measurement with TEM Cell acc. to IEC 61967-2

The ICEM TEM measurement service determines the electromagnetic radiation of an IC in the frequency range from 150 kHz to 1 GHz in accordance with the IEC 61967-2 standard. The test IC is mounted on an IC measurement adapter printed circuit board (PCB), which is fixed in a suitable opening of the TE…