Fault Injection
The ICI and ICI-DP probes allow for inject fast, transient magnetic or electric fields as well as current pulses into ICs. They are intended to use for electromagnetic fault injection (EMFI) or body biasing injection (BBI).
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ICI-DP HH150-15 set
Double Pulse Magnetic Field Source set
The set ICI-DP HH150-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection - EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of …
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ICI-DP HH250-15 set
Double Pulse Magnetic Field Source set
The set ICI-DP HH250-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection - EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of …
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ICI-DP HH500-15 set
Double Pulse Magnetic Field Source set
The set ICI-DP HH500-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection - EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of …
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ICI-DP set
Double Pulse Magnetic Field Source set
The ICI-DP set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection - EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of minimum 25 ns…
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ICI-DP HH1000-15 set
Double Pulse Magnetic Field Source set
The set ICI-DP HH1000-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection - EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of…
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ICI HH500-15 L-EFT set
Pulse Magnetic Field Source set
The ICI HH500-15 L-EFT set contains a pulse magnetic field source, which couples fast transient magnetic field pulses into test ICs. With this set electromagnetic fault injection (EMFI) attacks can be performed. In addition, the immunity of individual areas of a test IC can be investigated.
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ICI I900 L-EFT set
Pulse Current Probe set
The ICI I900 L-EFT set includes an ICI pulse current source that emits current pulses. This allows very accurate and high resolution IC analysis and body biased injection to be performed, e.g. for testing safety-critical circuits. Special features are the high-resolution tip (for testing extremely s…
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ICI E450 L-EFT set
Pulse E-Field Source set
The ICI E450 L-EFT set includes an E-field source which emits E-field pulses. This allows very accurate and high resolution IC analysis (fault injection) to be performed, such as for testing safety-critical circuits. Special features are the high-resolution peaks (for testing extremely small areas) …
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ICI 03 L-EFT set
IC EM Pulse Injection Langer Pulse
The ICI 03 L-EFT set consists of three different ICI sources emitting electric, magnetic field and current pulses. This allows high precision and very high resolution IC analysis and body bias injection. These sources allow side channel analysis e.g. to test security-critical circuits. Special featu…