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Milestones

Langer EMV-Technik GmbH develops measuring devices for accompanying EMV-analysis during the assembly development (PCB) and IC development (IC)

2019
Extension of frequency up to 20 GHz of near-field probes
2018
Extension of the analog measurement system A300 set with the AS 350 optical sensor with a measuring range of ± 50 V
2017
Development of IC EM pulse injection probe ICI L-EFT set for high precision and very high resolution IC analysis and side channel analysis
2015
Development of the ICT1 IC Tester
2015
Extension of frequency up to 10 GHz of near-field probes
2012
Extension of the analog measurement system with the A300 set with a bandwidth up to 5 MHz
2010
Extension of frequency up to 6 GHz of near-field probes
2009
Company certification as supporter of further education
2008
Launch of ESD-field sources for the IC Test
2008
Development of new ICR near-field microprobes for Langer IC scanner up to 6 GHz with an inner diameter of 100 µm
2007
Launch of the Langer IC scanners with ChipScan-Scanner software
2006
Extension of the analog measurement system with the A200 set with a bandwidth up to 500 kHz
2005
Launch of ICR near-field microprobes with an inner diameter of 150 µm
2003
Introduction of ICE1 IC Test Environment for RF-compliant current and voltage measurements and Burst current and Burst voltage supply in separate pins.
2002
Launch of ESA1 Emission Development System
2001
Research on emitted interference problems of automotive electronics
2000
Production of the first analog measurement system A100 set
1998
Magnetic field sources and E-field sources for Burst generators according to EN 61000-4-4, launch of the first RF near-field probes
1997
Development of the first digital optical measuring systems OSE
1996
Launch of E1 Immunity Development System
1994
Research for technological protection of assemblies against burst disturbance
1993
Start of industry EMC consulting
1980
Basic EMC research (18 patents and utility models / 4 European registrations)