Positioning Systems
Positioning systems (scanner) for all Langer Near-Field Probes, Langer Injection Probes (ICI and ICI-DP) and Near-Field Microprobes (ICR).
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Langer Scanner
Select from various positioning systems for automated PCB and IC scans with high-resolution measuring systems.
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Accessories for Langer Scanner
These accessories can be used to prepare the Langer Scanner for its specific measuring task.
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Near-field Scanner Probes
Passive near-field probes designed for the use in a scanner to measure E-field and magnetic field during development.