IC Security
With the products for IC security, ICs can be analyzed in detail using electromagnetic side-channel analysis (SCA) and their function can be specifically faulted with electromagnetic disturbance pulses (EMFI).
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Fault Injection
The ICI and ICI-DP probes allow for inject fast, transient magnetic or electric fields as well as current pulses into ICs. They are intended to use for electromagnetic fault injection (EMFI) or body biasing injection (BBI).
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Side-channel analysis
The near-field microprobes are designed for E-field and H-field measurements in a frequency range from 0.5 MHz to 6 GHz with a resolution from 60 µm to 300 µm.
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Positioning systems
Automated positioning solutions (IC scanner) for ICI and ICR Probes from Langer EMV-Technik.