Immunity
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DPI with Integrated Current and Voltage Measurement
Special test procedures are needed to determine the immunity of integrated circuits (IC) to RF interference. Defined RF disturbances have to be injected into the IC via defined networks for this purpose.
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EMC Design in the IC Environment with respect to ESD and Burst
Today's integrated circuits (IC) are very sensitive to disturbances. Fast pulses which were not perceived by slower ICs in the past may now lead to serious disturbances or even total failure. The characteristics of ICs can no longer be ignored if one wishes to ensure a high immunity to electromagnet…
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ESD Influence on ICs
Considerable follow-up costs in product development are caused due to the failure of electronic modules in EMC compliance tests. The integrated circuits that are used in an electronic system are decisive for its EMC performance as a whole. ICs are often responsible for interference emissions or immu…
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Immunity of Electronic Devices
Both the integration density of integrated circuits and their internal processing speed continue to rise, which also entails a higher susceptibility in terms of EMC. Fast disturbance pulses which were not even perceived by slower ICs in the past may now lead to serious trouble. Immunity tests on ind…
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ESD – EMC Problems in the Development of Electronic Modules
In this article you will learn about how you can save time and cost for your development by knowing ESD parameters of IC's
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From Device Testing to the IC Test System
Analyzing immunity at the IC level has the benefit of not requiring the impact of the device’s design on EMC to be considered. This includes, for example, the design of the printed circuit board, the nature and availability of the connector, or the housing construction. This article describes the co…