Langer Scanner
Select from various positioning systems for automated PCB and IC scans with high-resolution measuring systems.
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        							  ICS 105 setIC Scanner 4-Axis Positioning System The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field… 
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        							  FLS 106 IC setIC Scanner 4-Axis Positioning System The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly. The ICR near-field probes allow for the measurement of high-frequency… 
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        							  FLS 106 PCB setPCB Scanner, 3-Axis Positioning System The FLS 106 PCB Langer scanner is a 3-axes positioning system used in conjunction with near-field probes in order to measure magnetic or E-fields up to 20 GHz and to pulse the device under test via H-field sources with pulse fields up to 200 mT. The near-field probes or field sources can be moved a… 
 
          