Positioning systems and near-field probes with a resolution up to 60 µm.
Select from various positioning systems for automated PCB and IC scans with high-resolution measuring systems.
Near-Field Microprobes H- and E-Field
The near-field microprobes are designed for E-field and H-field measurements in a frequency range from 0.5 MHz to 6 GHz with a resolution from 60 µm to 300 µm.
Near-field Scanner Probes
Passive near-field probes designed for the use in a scanner to measure E-field and magnetic field during development.