• Contact us
  • Career
  • Terms and Conditions
  • Payment form
  • DE
  • EN
  • CN

Black cat logo Langer EMV-Technik

  • About us
    • Company
      • Career
      • Terms and Conditions
      • Company Profile
      • Milestones
    • Distributors
      • Asia
      • Europe
      • North America
    • Contact us
    • Map and Travel Information
    • Sponsoring
    • Events
    • Payment form
  • Products
    • PCB Immunity
      • Immunity Development System
      • Mini Burst Field Generators
      • Accessory EFT/Burst generators IEC 61000-4-4
      • Optical Signal Transmission
      • Burstdetector
    • PCB Emission
      • Measurement Technology for the Development Stage
      • Near-Field Probes
      • Preamplifier
      • Near-Field Microprobes
      • Optical Signal Transmission
    • IC Test System
      • IC Test Environment
      • Emission
      • Immunity
      • Simulation
    • IC Security
      • Fault Injection
      • Side-channel analysis
      • Positioning systems
    • Positioning Systems
      • Langer Scanner
      • Accessories for Langer Scanner
      • Near-field Scanner Probes
    • Software
      • CS-Scanner, ChipScan-Scanner Software / USB
      • CS-ESA set, ChipScan-ESA Software / USB
    • Measuring and Calibration Stations
      • PCB
      • IC
      • Connector
    • Equipment for Teaching and Training
      • EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
      • EMC-Basic 2 set, Demonstration Boards Near-Field Probes
      • DB 20 set, Demo Board 20
      • D10 set, EMC Demonstration Board
  • Seminars
    • SF-GE, Experimental EMC Seminar - Interference Immunity - Basics & Troubleshooting (3 days)
    • SF-G, EMC Experimental Seminar - Interference Immunity-Basics (2 days)
    • SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)
    • SA-G, EMC Experimental Seminar - Interference Emission - Basics (2 days)
    • SF IHS, Experimental EMC Inhouse Seminar - Interference Immunity 3 days
    • SA IHS, Experimental EMC Inhouse Seminar - Emission 2 days
    • Dates Overview
  • Services
    • EMC Workshops
      • WS ESA1, Workshop for Development System Emission
      • WS IC, EMC Workshop for Integrated Circuits
      • WS PCB, EMC-Workshop for Immunity and Emission
      • WS Scanner, Workshop for Langer Scanner
    • IC-EMC Analysis
      • Emission
      • Immunity
    • EMC Analysis
      • SMM Langer, Measuring of electromagnetic Shielding according to Langer method
      • COCI, Measurement of the Coupling Inductance of Connectors and Cables
    • EMV-B, EMC-Consulting / Hour
  • EMC Know-How
    • Technical article Board-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Technical article IC-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Langer EMV-Technik in scientific research
    • Newsletter
      • 17 ESA1 set
      • 16 ICI-DP sets
      • 15 tent and GP 23 set
      • 14 Mini Burst Field Generators in pocket size
      • 13 Achieve interference immunity by identifying and eliminating EMC weak points:
      • 12 ICR: Near-field analysis in the micrometer range and its advantages
      • 11 ChipSan-ESA now supports more measuring devices
      • 10 P512 and DPI
      • 09 Surface Scan on IC Level with high Resolution
      • 08 ESD and Efficient Electronic Design
      • 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
      • 06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
      • 05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
      • 04 Radiated Emissions at the PCB Level - An Introduction
      • 03 Interference suppression on a direct-current motor controlled by PWM
      • 02 XF sniffer probes and LVDS suppression
      • 01 MFA micro probes and LVDS suppression
    • Videos
      • How-to videos
      • EMC Webinar
  • PCB Immunity
    • Immunity Development System
    • Mini Burst Field Generators
    • Accessory EFT/Burst generators IEC 61000-4-4
    • Optical Signal Transmission
      • Analog
      • Digital
      • Bus Systems
        • OB 100 setOpto-Box 100 LIN and CAN
        • CAN 100 setBus System
        • LIN 100 setBus System
    • Burstdetector
  • PCB Emission
  • IC Test System
  • IC Security
  • Positioning Systems
  • Software
  • Measuring and Calibration Stations
  • Equipment for Teaching and Training
  • Products
  • PCB Immunity
  • Optical Signal Transmission
  • Bus Systems
  • LIN 100 set, Bus System
  • LIN 100, Optical Fiber Probe

LIN 100

Optical Fiber Probe

  • Short description
  • Technical parameters
Send enquiry Datasheet
  • LIN 100, Optical Fiber Probe
LIN 100, Optical Fiber Probe
Short description

The LIN 100 optical fiber field bus allows for potential free signal transmission according to LIN standards. The very small probe head is installed directly in the assembly. The bidirectional optical transmission path achieved through a double-plastic optical fibre cable is suitable for the signal transmission during EMC tests or for great potential differences.

The modules support the LIN specification up to a maximum transmission rate of 20 kbit/s. The edge steepness of the LIN signals can be set with an adjusting controller. While in operation, an internal pull-up resistance can also be switched on as the master.

Technical parameters
Transmission range 0 ... 20 kbit/s
Optical fibre connector 2 x 2.2 mm Ø
Radiated immunity > 200 V/m
Supply voltage 8 - 15 V (Master)
Supply voltage 8 - 30 V (Slave)
Current input max 45 mA
Max. optical fibre length 20 m
Sizes (L x W x H) (37 x 12 x 8) mm
  • © Langer EMV-Technik
  • Contact us
  • Legal notice
  • Privacy policy
  • Sponsoring
  • facebook
  • YouTube
  • Linked-In
  • Twitter
Europäischer Fonds für regionale Entwicklung EFRE - Europäischer Sozialfonds ESF