A200-1 set
Optical Fiber Probe 1-channel, 500 kHz
Short description
The A200-1 set consits of a sensor, which allows for oscilloscopically displaying analog signals under EFT/ESD/RF interference potential free. Disturbed signals can be easily detected. In the device under test the sensor transforms the measured analog signals into optical signals. The optical signals are transmitted via a fiber optical cable to the optical receiver which transforms them into electrical signals. These can be seen with an oscilloscope or can be used for controlling other devices. The system is suitable for monitoring a device under test in an anechoic chamber or for EMC optimizing of hard- and software.
Scope of delivery
- 1x AE 200, Optical Receiver
- 1x AS 200, Optical Sensor (50 / 10) V DC
- 1x LWL Ø 2.2 mm 1.5 m, Optical Fiber Single 1.5 m
- 1x NT FRI EU, Power Supply Unit
- 1x A200-1 acc, Accessories
- 1x A200-1 case, System Case
- 1x Analog m, User Manual
Technical parameters
Bandwidth | DC ... 500 kHz |
Sampling rate | 3 Msps |
Resolution | 12 Bit |
AE 200 Optical Receiver | |
Bandwidth | DC ... 500 kHz |
Voltage range - output | 0 V ... 10 V |
Optical input: Optical fiber | Ø 2.2 mm |
Supply voltage | 12 V ... 16 V |
Current input | ≈ 100 mA |
AS 200 Optical Sensor | |
Bandwidth | DC ... 500 kHz |
Measuring range | 0 V ... 50 V / 0 V ... 10 V DC (switchable) |
Input resistance | 100 kΩ |
Radiated immunity | > 100 V/m |
Supply voltage | 3 V ... 16 V |
Current input | ≈ 30 mA |
Optical fibre length | 1 m ... 20 m |
Scope of delivery details
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AE 200
Optical Receiver
The AE 200 optical receiver with its serial DAC receives optical signals from a sensor and transmits them as analog electrical signals via BNC connector to an oscilloscope or scaler. The receiver is suitable for the AS 200 type sensors.
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AS 200
Optical Sensor (50 / 10) V DC
The AS 200 sensor is an analog probe for nonreactive transmissions of analog signals out of the device under test during an interference . It is positioned directly onto the PC board of the device under test and is powered by the device under test. In the sensor, the analog signal is transformed via…