SX1 set
Near-Field Probes 1 GHz up to 10 GHz
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Measurement set-up near-field probes -
Application SX-R 3-1
Short description
The SX1 set consists of three passive near-field probes for measuring E-fields and magnetic fields with a high clock frequency from 1 GHz to 10 GHz on electronic assemblies and ICs during the development stage. The different probe heads of the SX1 set allow for measurements very close to the electronic assemblies, e.g. on single IC pins, conducting paths, components, and connectors, in order to localize interference sources. An electronic assembly’s field orientation and field distribution can be detected through specific use of the near-field probe. The near-field probes are small and handy. They have a current attenuating sheath and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.
High clock rates, e.g. above 3 GHz approach 10 GHz already at the 3rd harmonic. These harmonics are decoupled from RF sources on the board, e.g. conductor sections, ICs and other components. Other structural parts of the assembly can be excited to oscillate and lead to interference emission.
With the high internal base frequency of today’s assemblies, the measurement of harmonic frequency multiples is an important step towards an EMC-compliant assembly.
Scope of delivery
- 1x SX-E 03, E-Field Probe 1 GHz up to 10 GHz
- 1x SX-B 3-1, H-Field Probe 1 GHz up to 10 GHz
- 1x SX-R 3-1, H-Field Probe 1 GHz up to 10 GHz
- 1x SMA-SMA 1 m es, SMA-SMA Shielded Measurement Cable
- 1x Case 4, System Case Near-Field Probes for 4 probes
Recommended products
Technical parameters
| Frequency range | 1 GHz - 10 GHz |
| Connector | SMA, female, jack |
| Weight | 200 g |
Scope of delivery details
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SX-E 03
E-Field Probe 1 GHz up to 10 GHz
With 4x4 mm dimensions, the electrode on the underside of the probe head of the SX-E 03 is very compact. This allows for the localization of very small E-field sources, e.g. at conducting paths, single components, or on printed circuit boards.
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SX-B 3-1
H-Field Probe 1 GHz up to 10 GHz
The measurement coil of the SX-B 3-1 H-field probe is set at a 90° angle relative to the probe shaft. By positioning the probe head vertically, the measurement coil directly touches the surface of the printed circuit board. It is therefore possible to measure even hard to reach spots on the printed …
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SX-R 3-1
H-Field Probe 1 GHz up to 10 GHz
With its small probe head, the SX-R 3-1 can detect very high resolution RF-magnetic fields and can, therefore, identify even the smallest components as interference sources. Furthermore, the small probe head is designed to allow for measurements at less accessible areas, e.g. near IC pins.
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SMA-SMA 1 m es
SMA-SMA Shielded Measurement Cable
The "SMA-SMA 1 m es" measuring cable is a shielded RF cable with coaxial construction. The wave impedance is 50 ohm.