FLS 106 IC set
IC Scanner 4-Axis Positioning System
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FLS 106 with ICR microprobe
Short description
The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly.
The ICR near-field probes allow for the measurement of high-frequency magnetic or E-fields up to 6 GHz with a high measuring resolution of 50 to 100 µm.
The IC scanner can be set up for surface scans and ESD or EFT immunity tests in a few simple steps.
Scope of delivery
- 1x FLS 106 IC, 4-Axis Positioning System
- 1x CS-Scanner, ChipScan-Scanner Software / USB
- 1x GND 25, Ground Plane
- 1x UH DUT, Universal Holder for Langer scanner
- 1x DM-CAM, Digital Microscope Camera
- 1x Rotary unit, Rotary Unit
- 1x DM-CAM holder.3, Microscope Camera Holder
- 1x FLS 106 IC acc, Accessories for scanner
Recommended products
- ICR Probe, Your selection from our range of near-field microprobes
- ICI 01 L-EFT set, IC EM Pulse Injection Langer Pulse
- XF Product family, Near-Field Probes 30 MHz up to 6 GHz
- SX1 set, Near-Field Probes 1 GHz up to 10 GHz
- PA 306 SMA, Preamplifier 100 kHz up to 6 GHz
- SH 01, Probe Holder for Langer scanner
- UH DUT set, Universal Holder for Langer scanner
Technical parameters
| Supply voltage | 110 V / 230 V |
| Interface | USB |
| Axes x, y, z; α | |
| Max. traverse range | (400 x 600 x 120) mm; α-Rotation ±180° |
| Min. step size | (20 x 20 x 20) µm; α-Rotation 1° |
| Positioning speed | (20 x 25 x 10) mm/s; α-Rotation 90°/s |
| Weight | 75 kg |
| Sizes (L x W x H) | (1030 x 775 x 900) mm |
Scope of delivery details
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FLS 106 IC
4-Axis Positioning System
The FLS 106 4-axis positioning system is used to move near field probes in four axises and to rotate the near field probes above a DUT.
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CS-Scanner
ChipScan-Scanner Software / USB
The ChipScan-Scanner software is used for the automated measurement of electric and magnetic near fields of electronic assemblies. The software enables measurements in a plane or in the volume above the assembly, visualization of the measurement results for fast and accurate evaluation of the near f…
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GND 25
Ground Plane
The GND 25 ground plane ensures the RF-compatible contacting of the probe during an EMC measurement at a test IC. The GND 25 consists of steel with a gold plated surface. The recess (103 mm x 103 mm) is designed for the placement of GNDA ground adapters (GNDA 01-04) and TEM cell prints (100 mm x 100 mm).
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UH DUT
Universal Holder for Langer scanner
The universal holder is designed for the fixation of electronic assemblies on the scanner. Continuously adjustable claws, which are fixed with M3 screws into the holes of UH DUT, allow the flexible positioning of the device being tested on the universal holder.
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DM-CAM
Digital Microscope Camera
The digital microscope camera is an essential part of a Langer-Scanner and makes it easier to position the near-field probes above the DUT.