XFS-R 3-1

Scanner Probe 30 MHz up to 6 GHz

The XFS-R 3-1 scanner probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.

XFS-B 3-1

Scanner Probe 30 MHz up to 6 GHz

The measuring coil of the XFS-B 3-1 magnetic field scanner probe is arranged orthogonally to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boar…

XFS-E 10

Scanner Probe 30 MHz up to 6 GHz

The electrode in the probe head of the XFS-E 10 scanner probe has a width of approx. 0.2 mm. With the probe even smallest E-field sources can be located, e.g. conducting paths with a width of 0.1 mm or single pins on multi pinned ICs. To measure, the E-field probe is positioned onto the object.

XFS-E 09s

Scanner Probe 30 MHz up to 6 GHz

The electrode on the probe head of the XFS-E 09s scanner probe detects electrical fields which, for example are decoupled above the IC's surface. The probe's resolution allows for measurements with a distance of 0.5 mm to 10 mm above an assembly. For measurement, the E-field probe is placed on the target.