• Contact us
  • Career
  • Terms and Conditions
  • Payment form
  • DE
  • EN
  • CN

Black cat logo Langer EMV-Technik

  • About us
    • Company
      • Career
      • Terms and Conditions
      • Company Profile
      • Milestones
    • Distributors
      • Asia
      • Europe
      • North America
    • Contact us
    • Map and Travel Information
    • Sponsoring
    • Events
    • Payment form
  • Products
    • PCB Immunity
      • Immunity Development System
      • Mini Burst Field Generators
      • Accessory EFT/Burst generators IEC 61000-4-4
      • Optical Signal Transmission
      • Burstdetector
    • PCB Emission
      • Measurement Technology for the Development Stage
      • Near-Field Probes
      • Preamplifier
      • Near-Field Microprobes
      • Optical Signal Transmission
    • IC Test System
      • IC Test Environment
      • Emission
      • Immunity
      • Simulation
    • IC Security
      • Fault Injection
      • Side-channel analysis
      • Positioning systems
    • Positioning Systems
      • Langer Scanner
      • Accessories for Langer Scanner
      • Near-field Scanner Probes
    • Software
      • CS-Scanner, ChipScan-Scanner Software / USB
      • CS-ESA set, ChipScan-ESA Software / USB
    • Measuring and Calibration Stations
      • PCB
      • IC
      • Connector
    • Equipment for Teaching and Training
      • EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
      • EMC-Basic 2 set, Demonstration Boards Near-Field Probes
      • DB 20 set, Demo Board 20
      • D10 set, EMC Demonstration Board
  • Seminars
    • SF-GE, Experimental EMC Seminar - Interference Immunity - Basics & Troubleshooting (3 days)
    • SF-G, EMC Experimental Seminar - Interference Immunity-Basics (2 days)
    • SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)
    • SA-G, EMC Experimental Seminar - Interference Emission - Basics (2 days)
    • SF IHS, Experimental EMC Inhouse Seminar - Interference Immunity 3 days
    • SA IHS, Experimental EMC Inhouse Seminar - Emission 2 days
    • Dates Overview
  • Services
    • EMC Workshops
      • WS ESA1, Workshop for Development System Emission
      • WS IC, EMC Workshop for Integrated Circuits
      • WS PCB, EMC-Workshop for Immunity and Emission
      • WS Scanner, Workshop for Langer Scanner
    • IC-EMC Analysis
      • Emission
      • Immunity
    • EMC Analysis
      • SMM Langer, Measuring of electromagnetic Shielding according to Langer method
      • COCI, Measurement of the Coupling Inductance of Connectors and Cables
    • EMV-B, EMC-Consulting / Hour
  • EMC Know-How
    • Technical article Board-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Technical article IC-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Langer EMV-Technik in scientific research
    • Newsletter
      • 17 ESA1 set
      • 16 ICI-DP sets
      • 15 tent and GP 23 set
      • 14 Mini Burst Field Generators in pocket size
      • 13 Achieve interference immunity by identifying and eliminating EMC weak points:
      • 12 ICR: Near-field analysis in the micrometer range and its advantages
      • 11 ChipSan-ESA now supports more measuring devices
      • 10 P512 and DPI
      • 09 Surface Scan on IC Level with high Resolution
      • 08 ESD and Efficient Electronic Design
      • 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
      • 06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
      • 05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
      • 04 Radiated Emissions at the PCB Level - An Introduction
      • 03 Interference suppression on a direct-current motor controlled by PWM
      • 02 XF sniffer probes and LVDS suppression
      • 01 MFA micro probes and LVDS suppression
    • Videos
      • How-to videos
      • EMC Webinar
  • PCB Immunity
  • PCB Emission
    • Measurement Technology for the Development Stage
      • ESA1 setEmission Development System
      • HFW 21 setRF Current Transformer 100 kHz up to 1 GHz
      • Z23-1 setShielding Tent (900 x 500x 400) mm
      • Z23-2 setShielding Tent (900 x 500 x 650) mm
      • NNB 21 setLine Impedance Stabilisation Network
    • Near-Field Probes
    • Preamplifier
    • Near-Field Microprobes
    • Optical Signal Transmission
  • IC Test System
  • IC Security
  • Positioning Systems
  • Software
  • Measuring and Calibration Stations
  • Equipment for Teaching and Training
  • Products
  • PCB Emission
  • Measurement Technology for the Development Stage
  • ESA1 set, Emission Development System
  • RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz

RF-B 3-2

H-Field Probe 30 MHz up to 3 GHz

  • Short description
  • Recommended products
  • Technical parameters
Send enquiry Datasheet
  • RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz
  • Probe head
    Probe head
RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz Probe head
  • RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz
  • Probe head
Short description

The measurement coil of the RF-B 3-2 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are typically hard to access, e.g. between large components of switching controllers.

The RF-B 3-2 is a passive near-field probe which detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected.
In contrast to the RF-R 3-2 H-field probe, its coil is positioned in the probe tip at a 90° angle. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters
Frequency range 30 MHz ... 3 GHz
Resolution ≈ 2 mm
Probe head dimensions: Ø ≈ 4 mm
Connector - output SMB, male, jack
Weight 15 g
Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m]
H-field correction curve [dBµA/m] / [dBµV] H-field correction curve [dBµA/m] / [dBµV] H-field correction curve [dBµA/m] / [dBµV]
Current correction curve [dBµA] / [dBµV] Current correction curve [dBµA] / [dBµV] Current correction curve [dBµA] / [dBµV]
Measuring principles Measuring principles Measuring principles
  • © Langer EMV-Technik
  • Contact us
  • Legal notice
  • Privacy policy
  • Sponsoring
  • facebook
  • YouTube
  • Linked-In
  • Twitter
Europäischer Fonds für regionale Entwicklung EFRE - Europäischer Sozialfonds ESF