ES 08D
E-Field Source
![ES 08D, E-Field Source](/fileadmin/Bilder alt_neu/ES08D-Grafik.jpg?v=1721113204126)
![Application ES 08D](/fileadmin/Bilder alt_neu/ES-08-D-Anwendung.jpg?v=1721113206638)
Short description
The ES 08D E field source is a probe tip, which is used to determine the sensibility of an IC pin or a conductor. During the test the probe tip is bonded with the pin / conducting path. By changing the intenstity of the burst impulse at SGZ 21 the sensitivity of the pin is determined.