The double pulse magnetic field source ICI-DP HH250-15 is a probe with which fast transient magnetic field pulses can be injected into DUTs e.g. ICs. It is designed for EM fault injection (EMFI) in IC safety applications. With this probe, single pulse as well as a double pulse sequence with a pulse following time of minimum 25 ns can be injected into integrated circuits with precise timing and location.

Via the “sync” inputs, single pulses or double pulses can be injected into the functional sequence of the DUT in a synchronized manner. The probe is powered and controlled via the Burst Power Station BPS 204.