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XF-U 2.5-1

H-Field Probe 30 MHz up to 6 GHz

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  • XF-U 2.5-1, H-Field Probe 30 MHz up to 6 GHz
  • Probe head
    Probe head
XF-U 2.5-1, H-Field Probe 30 MHz up to 6 GHz Probe head
  • XF-U 2.5-1, H-Field Probe 30 MHz up to 6 GHz
  • Probe head
Short description

The XF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the measured object.

The XF-U 2.5-2 is a passive near-field probe that is designed for SMD components (pins). The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.

Technical parameters
Frequency response [dBµV] / [dBµA/m] H-field correction curve [dBµA/m] / [dBµV] Current correction curve [dBµA] / [dBµV] Measuring principles
Frequency range 30 MHz ... 6 GHz
Resolution ≈ 0.5 mm
Probe head dimensions: Ø ≈ 4 mm
Connector - output SMA, female, jack
Weight 15 g
Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m]
H-field correction curve [dBµA/m] / [dBµV] H-field correction curve [dBµA/m] / [dBµV]
Current correction curve [dBµA] / [dBµV] Current correction curve [dBµA] / [dBµV]
Measuring principles Measuring principles