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RF-E 05

E-Field Probe 30 MHz up to 3 GHz

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  • RF-E 05, E-Field Probe 30 MHz up to 3 GHz
  • Probe head
    Probe head
RF-E 05, E-Field Probe 30 MHz up to 3 GHz Probe head
  • RF-E 05, E-Field Probe 30 MHz up to 3 GHz
  • Probe head
Short description

The electrode at the underside of the probe head of the RF-E 05 has a width of approx. 0.5 mm. The E-fields of clocked lines, IC pins, and smaller components are precisely located. The RF-E 05 probe was developed for Langer scanner.

The RF-E 05 is a near-field probe. It has the same structure as the RF-E 02 and RF-E 10 probes, but detects E-fields from very small ranges. The RF-E 05 is designed to detect the specific cause of an electrical interference field. For measurements the E-field probe is positioned directly onto or held above the components or surfaces of printed circuit boards.The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters
Frequency response [dBµV] / [dBµV/mm] E- field correction curve [dBµV/mm] / [dBµV] Measuring principles
Frequency range 30 MHz ... 3 GHz
Resolution ≈ 0.6 mm
Probe head dimensions: ≈ (1 x 8) mm
Connector - output SMB, male, jack
Frequency response [dBµV] / [dBµV/mm] Frequency response [dBµV] / [dBµV/mm]
E- field correction curve [dBµV/mm] / [dBµV] E- field correction curve [dBµV/mm] / [dBµV]
Measuring principles Measuring principles