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ICIM EFT

Measuring service IC Immunity Measurement Line Conducted acc. IEC 62215-3

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Short description

The ICIM EFT measurement service measures the immunity of an IC to standardized conducted transient electrical disturbances according to IEC 62215-3. The disturbances, generated by an EFT/burst generator according to standard IEC 61000-4-4, which are not necessarily matched to the operation of the device under test, are applied to the terminals of the IC via different coupling networks (CK). This procedure enables the understanding and classification of interactions between conducted transient disturbances and the degradation of the IC’s function.

P250 equivalent circuit diagram
Advantage of Measurements with Probes from Langer EMV-Technik

During the immunity measurement with the P250 probe, each individual IC pin (e.g. QFP, QFN packages) or even the balls of a BGA can be individually contacted and pulsed.
The measurement complies with the IEC 62215-3 standard, with the networks (CK) normally connected at the pin for coupling the interference pulses being included in the respective probe. Due to the easy change of the coupling network by exchanging the probe tip, the application becomes even more flexible.

What is needed from the Customer?
  • Data sheet of the IC
  • Test circuit diagram (in coordination with test engineer)
  • Test firmware with description (in coordination with test engineer)
  • 5 - 10 ICs with test firmware
What does the Customer get?
  • 10 test PCBs, assembled/unassembled, depending on the number of test ICs
  • Documentation of the measurement results
  • Test report (Test Report - EFT Test)

The preparation of a quotation depends on the exact measurement task (e.g. number of pins, frequency range) of the customer. Please contact the sales department of Langer EMV-Technik GmbH.