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XFS-E 09s

Scanner Probe 30 MHz up to 6 GHz

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XFS-E 09s, Scanner Probe 30 MHz up to 6 GHz
  • XFS-E 09s, Scanner Probe 30 MHz up to 6 GHz
Short description

The electrode on the probe head of the XFS-E 09s scanner probe detects electrical fields which, for example are decoupled above the IC’s surface. The probe’s resolution allows for measurements with a distance of 0.5 mm to 10 mm above an assembly. For measurement, the E-field probe is placed on the target.

The XSF-E 09s is a passive near-field probe. To measure, the E-field probe is positioned above or onto components and printed circuit boards. It has a current attenuating sheath and, therefore, its upper half is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field scanner probe has an internal terminating resistance.

Technical parameters
Frequency response [dBµV] / [dBµA/m] E- field correction curve [dBµV/mm] / [dBµV] Measuring principles
Frequency range 30 MHz ... 6 GHz
Resolution ≈ 0.2 mm
Probe head dimensions: ≈ (10 x 10) mm
Connector - output SMA, male, jack
Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m]
E- field correction curve [dBµV/mm] / [dBµV] E- field correction curve [dBµV/mm] / [dBµV]
Measuring principles Measuring principles