Langer EMV - LFS-B 3, Scanner Probe 100 kHz up to 50 MHz

LFS-B 3

Scanner Probe 100 kHz up to 50 MHz

LFS-B 3-2 scanner probe connected to ICS 105 scanner

Short description

The measuring coil of the H-field probe LFS-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured.
This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. between large components of switching controllers.

The LFS-B 3 is a passive near-field probe for use in a scanner to measure magnetic field during development. The LFS-B 3 detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected. The near-field probe is small and handy. It has a current attenuating sheath and is, therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters

Frequency range	100 kHz ... 50 MHz
Resolution	≈ 2 mm
Probe head dimensions:	Ø ≈ 4 mm
Connector - output	SMA, male, jack
Frequency response [dBµV] / [dBµA/m]
H-field correction curve [dBµA/m] / [dBµV]
Current correction curve [dBµA] / [dBµV]
Measuring principles