EMC-Basic 2 set
Demonstration Boards Near-Field Probes
Short description
The SA 11 and SA 21 demonstration boards are assemblies for displaying emission phenomena.
These boards allow demonstrations of various EMC measurement devices such as spectrum analyzers and near-field probes from all manufacturers. Similarly, emission measurements with antennas are possible. With the demonstration boards, magnetic (SA 11) and electric (SA 21) emission effects can be shown on one board each with the help of suitable near-field probes (B-field: RF-R 50-1 and E-field: RF-E 05).
Scope of delivery
- 1x SA 11, Demo Board Emission B-field
- 1x SA 21, Demo Board Emission E-field
- 1x RF-R 50-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 05, E-Field Probe 30 MHz up to 3 GHz
- 1x SMB-BNC 1 m, SMB-BNC Measurement Cable
- 1x NT FRI EU, Power Supply Unit
- 1x LK 25 cm rt, Lab Cable 25 cm, red
- 1x LK 25 cm bl, Lab Cable 25 cm, blue
- 1x A4 case, System Case
Scope of delivery details
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SA 11
Demo Board Emission B-field
The SA 11 demo board is a board on which demonstration experiments for magnetic field for interference emission are performed. A spectrum analyzer is used to display the measurement results. The SA 11 can be used to demonstrate antennas, near-field probes, the ESA1 interference emission development …
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SA 21
Demo Board Emission E-field
The SA 21 demo board is a board on which demonstration experiments for electric field for interference emission are performed. A spectrum analyzer is used to display the measurement results. The SA 21 can be used to demonstrate antennas, near-field probes, the ESA1 interference emission development …
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RF-R 50-1
H-Field Probe 30 MHz up to 3 GHz
The RF-R 50-1 H-field probe is designed for measurements at assemblies, devices, or cables at distances up to approx. 3 cm. The H-field probe can identify larger components as interference sources.
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RF-E 05
E-Field Probe 30 MHz up to 3 GHz
The electrode at the underside of the probe head of the RF-E 05 has a width of approx. 0.5 mm. The E-fields of clocked lines, IC pins, and smaller components are precisely located. The RF-E 05 probe was developed for Langer scanner.