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Products
PCB Immunity
Immunity Development System
Mini Burst Field Generators
Accessory EFT/Burst generators IEC 61000-4-4
Optical Signal Transmission
Burstdetector
PCB Emission
Measurement Technology for the Development Stage
Near-Field Probes
Preamplifier
Near-Field Microprobes
Optical Signal Transmission
IC Test System
IC Test Environment
Emission
Immunity
Simulation
IC Security
Fault Injection
Side-channel analysis
Positioning systems
Positioning Systems
Langer Scanner
Accessories for Langer Scanner
Near-field Scanner Probes
Software
CS-Scanner, ChipScan-Scanner Software / USB
CS-ESA set, ChipScan-ESA Software / USB
Measuring and Calibration Stations
PCB
IC
Connector
Epuipment for Teaching and Training
EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
EMC-Basic 2 set, Demonstration Boards Near-Field Probes
DB 20 set, Demo Board 20
D10 set, EMC Demonstration Board
Seminars
SF-GE, Experimental EMC Seminar - Interference Immunity - Basics & Troubleshooting (3 days)
SF-G, EMC Experimental Seminar - Interference Immunity-Basics (2 days)
SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)
SA-G, EMC Experimental Seminar - Interference Emission - Basics (2 days)
SF IHS, Experimental EMC Inhouse Seminar - Interference Immunity 3 days
SA IHS, Experimental EMC Inhouse Seminar - Emission 2 days
Dates Overview
Services
EMC Workshops
WS ESA1, Workshop for Development System Emission
WS IC, EMC Workshop for Integrated Circuits
WS PCB, EMC-Workshop for Immunity and Emission
WS Scanner, Workshop for Langer Scanner
IC-EMC Analysis
Emission
Immunity
EMC Analysis of Plug-and-Socket Connectors and Cables
COCI, Measurement of the Coupling Inductance of Connectors and Cables
EMV-B, EMC-Consulting / Hour
EMC Know-How
Technical article Board-EMC
Basic Knowledge
Immunity
Emission
Technical article IC-EMC
Basic Knowledge
Immunity
Emission
Langer EMV-Technik in scientific research
Newsletter
10 P512 and DPI
09 Surface Scan on IC Level with high Resolution
08 ESD and Efficient Electronic Design
07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
04 Radiated Emissions at the PCB Level - An Introduction
03 Interference suppression on a direct-current motor controlled by PWM
02 XF sniffer probes and LVDS suppression
01 MFA micro probes and LVDS suppression
Videos
How-to videos
EMC Webinar
PCB Immunity
PCB Emission
Measurement Technology for the Development Stage
Near-Field Probes
LF, Passive, 100 kHz up to 50 MHz
RF, Passive, 30 MHz up to 3 GHz
XF, Passive, 30 MHz up to 6 GHz
SX, Passive, 1GHz up to 20 GHz
HR, Passive, up to 40 GHz
HR1 set
Near-Field Probes up to 40 GHz
HR-R 8-1 set
Near-Field Probe Set up to 40 GHz B-field
HR-R 8-1
Near-field probe up to 40 GHz B-field
HR-E 40-1 set
Near-Field Probe Set up to 40 GHz E-field
HR-E 40-1
E-Field Probe up to 40 GHz
MFA, Active, 1MHz up to 6 GHz
CM-SHP
Customized Shapes
Individual Characterization
Product Characterization
Preamplifier
Near-Field Microprobes
Optical Signal Transmission
IC Test System
IC Security
Positioning Systems
Software
Measuring and Calibration Stations
Epuipment for Teaching and Training
Products
PCB Emission
Near-Field Probes
HR, Passive, up to 40 GHz
HR1 set, Near-Field Probes up to 40 GHz
CS-ESA Viewer, ChipScan-ESA Viewer Software / USB
CS-ESA Viewer
ChipScan-ESA Viewer Software / USB
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Datasheet
